Get current pricing for Jeol, JWS-7555 Wafer Inspection Sem With X-ray Detector. Resolution: 5 Nm. Magnification: 100x To 200,000x. Field Emission Electron Gun. X-y Stage Travel: 200 Mm. . Product Category: Lab Equipment, Sub Category: Analytical Instruments:

Urgent Requirement - item is needed immediately.

Product Information/Quote Request - needed as soon as possible

Manufacturer: Jeol Part number: JWS-7555 Description: Wafer Inspection Sem With X-ray Detector. Resolution: 5 Nm. Magnification: 100x To 200,000x. Field Emission Electron Gun. X-y Stage Travel: 200 Mm. . Product Category: Lab Equipment, Sub Category: Analytical Instruments

Quantity Required:

Desired Condition:

New Refurbished Either

Your Name:

Email Address:

Confirm Email Address:

Question/Comment:

please submit once - request may take a few seconds

Quote & Product Information

Manufacturer: Jeol Part number: JWS-7555 Description: Wafer Inspection Sem With X-ray Detector. Resolution: 5 Nm. Magnification: 100x To 200,000x. Field Emission Electron Gun. X-y Stage Travel: 200 Mm. . Product Category: Lab Equipment, Sub Category: Analytical Instruments