Get current pricing for Tencor, SURFSCAN AIT Model 8 Advanced In-line Defect Inspection System. Automated Full Wafer Inspection System For Detecting Particles As Small As 0.10 Micro-meters On Bare Silico . Product Category: Semiconductor, Sub Category::

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Manufacturer: Tencor Part number: SURFSCAN AIT Model 8 Description: Advanced In-line Defect Inspection System. Automated Full Wafer Inspection System For Detecting Particles As Small As 0.10 Micro-meters On Bare Silico . Product Category: Semiconductor, Sub Category:

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Manufacturer: Tencor Part number: SURFSCAN AIT Model 8 Description: Advanced In-line Defect Inspection System. Automated Full Wafer Inspection System For Detecting Particles As Small As 0.10 Micro-meters On Bare Silico . Product Category: Semiconductor, Sub Category: