Get current pricing for Rudolph, Auto EL III-2 Ellipsometer 633 Hene Laser Source 4a Option, X/y Stage With Slide Tray Wavelengths Of 405nm <1a Or 1%, Whichever Is Greater, Repeatability . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

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Manufacturer: Rudolph Part number: Auto EL III-2 Description: Ellipsometer 633 Hene Laser Source 4a Option, X/y Stage With Slide Tray Wavelengths Of 405nm <1a Or 1%, Whichever Is Greater, Repeatability . Product Category: Semiconductor, Sub Category: Metrology And Inspection

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Manufacturer: Rudolph Part number: Auto EL III-2 Description: Ellipsometer 633 Hene Laser Source 4a Option, X/y Stage With Slide Tray Wavelengths Of 405nm <1a Or 1%, Whichever Is Greater, Repeatability . Product Category: Semiconductor, Sub Category: Metrology And Inspection