Get current pricing for Ade, ADE UltraScan 9300 Wafer-48210-ID Non-contact Capacitive Probe Measurement 10nm Resolution 400 To 1000 Microns Wafer Thickness Range Capable Of Handling 100mm To 200mm Wafers. Capa . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

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Manufacturer: Ade Part number: ADE UltraScan 9300 Wafer-48210-ID Description: Non-contact Capacitive Probe Measurement 10nm Resolution 400 To 1000 Microns Wafer Thickness Range Capable Of Handling 100mm To 200mm Wafers. Capa . Product Category: Semiconductor, Sub Category: Metrology And Inspection

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Manufacturer: Ade Part number: ADE UltraScan 9300 Wafer-48210-ID Description: Non-contact Capacitive Probe Measurement 10nm Resolution 400 To 1000 Microns Wafer Thickness Range Capable Of Handling 100mm To 200mm Wafers. Capa . Product Category: Semiconductor, Sub Category: Metrology And Inspection